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unbekannt CTX125 X-RAY System Kontrolleinheit

Tahun pembuatan: 2025, Kondisi: baru, X-ray inspection system for medium-sized packages and pouches. Suitable for the detection of foreign objects such as metal, glass, stone, plastic, etc., in food or non-food items. Lajdpfjv Nm Injx Aahjk - Specifications: Conveyor belt width: 410 mm; Detection accuracy: Pb from Ø 0.2 mm, Fe from Ø 0.28 mm, SUS from Ø 0.28 mm, non-metallic (such as stone, glass) from Ø 1.2 mm; X-ray power: 80 kVp, 1.25 mA; Detector resolution: 0.4 mm; X-ray emissions: < 1µSv/h; Conveyor height: 850 ± 30 mm; Conveyor speed (product-dependent): 10–100 m/min; User interface: 15" touchscreen; Software: intellisens®X-ray; Operating temperature: 5–35 °C; Rejection system: optionally available based on requirements; Power supply: 220VAC, 50/60Hz; System dimensions: L900 x W920 x H1825 mm; Weight: 350 kg. Please note that our new prices are often below the typical prices for used equipment. Feel free to contact us and tell us about your packaging requirements. We always have 30–50 different new machines immediately available from stock. For machines built to customer specifications, we offer very short delivery times starting from about 3 weeks. All machines are supplied with a full warranty.

Kondisi: Pembawa suku cadang rusak (bekas), Oxford Instruments X-Strata 960 X-Ray Fluorescence Analyzer – For Parts / Defective Item Description: For sale is a used X-ray fluorescence analyzer, model Oxford Instruments X-Strata 960. The device comes from a laboratory decommissioning and is offered strictly as a parts donor or for repair purposes only. No function test has been carried out – the device is therefore considered defective for the purposes of this sale. Technical Data – Oxford Instruments X-Strata 960 (non-binding): Feature Description Model X-Strata 960 Manufacturer Oxford Instruments Analysis method X-ray fluorescence analysis (XRF) Typical applications Coating thickness measurement, material analysis, precious metal testing Measurement geometry Top-down or bottom-up, depending on configuration Radiation source X-ray tube (e.g. Rhodium anode), 50–100 W power Detector Proportional counter or silicon drift detector (SDD), depending on version Measurement range Coating thickness approx. 0.005 – 50 µm (material-dependent) Spot size Approx. 15 μm – 1 mm (depending on collimator) Z-axis travel Motorized, up to approx. 230 mm measurement height Lodpfx Aashaapfsheak Sample chamber (W × D × H) Approx. 580 × 510 × 230 mm Sample stage Manual or motorized (200 × 200 mm or larger, depending on equipment) Focusing system Optical / laser focus, semi-automatic in some cases Operating system Integrated industrial PC with Windows-based evaluation software Power supply 220–240 V / 50–60 Hz / approx. 500–800 W Device weight Approx. 150–200 kg (depending on version) Condition: used / defective / for parts Scope of delivery: as per images – without accessories or software Important Notes: Sale is expressly as a defective device without functional guarantee. Item is offered as a parts donor or for tinkerers. No guarantee as to function, completeness, or technical parameters. Commercial sale, excluding any liability for material defects, in accordance with § 447 BGB (sale by dispatch). Scope of Delivery: • Oxford Instruments X-Strata 960 • All components visible in the images • Any further parts, accessories, or documentation are not included unless explicitly stated. Shipping & Collection: • Collection possible and preferred in Borken • Shipping available by arrangement (Subject to change and errors in technical data and information!) For further questions, please feel free to contact us by telephone.

Tahun pembuatan: 2016, Kondisi: sangat baik (bekas), Automatic X-ray Inspection For the inspection of BGA, QFN, THT, LED, LGA, and other solder joints, whether visible or concealed. Other features: - Includes offline station and repair station - OS: Windows 7 - Ultra-high-speed line-scan CCD detectors - Inspection area: 450 mm x 400 mm - Image acquisition: 2D, 2.5D, 3D (layer images with planar CT) - PCB dimensions: 60 – 450 x 50 – 400 mm - AXI resolution: 6 – 30 µm / px Laedpfx Aaewpuadjhjk AOI: - Camera field of view: 42 mm x 42 mm - Resolution: 21 µm - Inspection height: -3 to 7.5 mm - Optics: telecentric - Transport height: 950 mm ± 25 mm - Interface: SMEMA - Automatic width adjustment

Tahun pembuatan: 2016, Kondisi: siap digunakan (bekas), A like-new Anritsu X-ray inspection system is available. X-ray output: 100W, max. detection width: 240mm, max. detection height: 120mm, detection speed for 2kg to 5kg: 10m-60m/min, detection speed up to 2kg: 60m-90m/min, detection speed for 5kg to 10kg: 10m-40m/min, housing material: stainless steel, machine weight: approx. 255kg, operating hours: under 50h. The machine shows no wear on the conveyor belt or the radiation protection curtains. Documentation available. Inspection on site possible. Laedpfevzr Auox Aahek

Kondisi: bekas, PANalytical X’Pert PRO MPD X-ray Diffractometer (XRD) Excerpt from service report: Device: PANalytical X’Pert PRO MPD Date: 2021-07-07 Work performed: - Reinstallation and commissioning of the system - Connection of external supply lines - Warm-up phase - Complete alignment of goniometer and other components - Maintenance including replacement of defective parts Spare parts used: L 3.6V NC/U3 R15.0X52.0 BATTERY. NI-CD FAN FOR X-CELERATOR UNIT FAN FILTER FILTER, WATER Motor PW3050 ([Device was not tested by us on-site]) The X’Pert PRO MPD is a highly versatile and powerful X-ray diffractometer (XRD) for structural characterization of crystalline materials. – Perfectly suited for pure research as well as routine applications in industry and academia. Thanks to its modular design, fast detection, temperature and atmosphere control, it is equally well suited for routine analyses and complex in-situ experiments. Key Features: Various measurement geometries possible: - Reflection in Bragg-Brentano (θ–2θ) mode - Transmission geometry for powder in capillaries - Optional SAXS (Small-Angle X-ray Scattering) for nanostructures Radiation source and detectors: - Typically copper anode (Cu-Kα, λ ≈ 1.54 Å) - X’Celerator detector (1D, ultra-fast) for parallel data acquisition Modular system with PreFIX technology: - Fast exchange of optics and sample stages without recalibration In-situ measurements at high temperatures: - Measurements up to approx. 1200°C possible - Controlled atmosphere: air, nitrogen, oxygen (limited reducing conditions) Typical applications: - Phase analysis and quantitative Rietveld refinement - Determination of crystallite size, microstrain, residual stresses - In-situ studies of phase transitions, oxidation, crystallization etc. - SAXS measurements for analyzing nanoparticles, pore structures Broad range of sample types: powders, thin films, ceramics, pharmaceuticals, catalysts, and much more. Technical specifications (typical): Property / Specification Angle range (2θ) approx. 0.5° to 150° Step size up to 0.002° or finer Goniometer Vertical, 0–0, radius approx. 240 mm Temperature range Room temperature up to approx. 1200°C Atmosphere Air, N₂, O₂ (limited reducing conditions) Detectors X’Celerator (1D), proportional counter Prevalence & locations in use: The X’Pert PRO MPD is used worldwide, e.g. at: Universities (ETH Zurich, TU Dresden, University of Vienna) Research institutes (e.g. Max Planck Institutes, ICN2, IS2M) Industry (e.g. materials development, pharmaceuticals, chemicals) Condition: used Scope of delivery: (see image) (Subject to change or errors in technical data. Specifications and information may change!) We are happy to answer further questions by phone. Laedpfx Aaewycatshsk

Kondisi: baik (bekas), Helmut Fischer Fischerscope X-ray fluorescence coating thickness measurement XDL- XYmZ Ljdpfx Aasw Hbkdohjak