Difraktometer sinar-X (XRD)PANalytical
X’Pert PRO MPD
Difraktometer sinar-X (XRD)
PANalytical
X’Pert PRO MPD
harga tetap ditambah PPN
€13.500
Kondisi
Bekas
Lokasi
Borken 

Gambar menunjukkan
Tampilkan peta
Data mesin
Harga & Lokasi
harga tetap ditambah PPN
€13.500
- Lokasi:
- Einsteinstraße 8a, 46325 Borken, Deutschland

Hubungi
Rincian penawaran
- ID iklan:
- A19531791
- Nomor referensi:
- 24688
- Pembaruan:
- terakhir pada 10.07.2025
Deskripsi
PANalytical X’Pert PRO MPD X-ray Diffractometer (XRD)
Excerpt from service report:
Device: PANalytical X’Pert PRO MPD
Date: 2021-07-07
Work performed:
- Reinstallation and commissioning of the system
- Connection of external supply lines
- Warm-up phase
- Complete alignment of goniometer and other components
- Maintenance including replacement of defective parts
Spare parts used:
L 3.6V NC/U3 R15.0X52.0 BATTERY. NI-CD
FAN FOR X-CELERATOR UNIT FAN
FILTER FILTER, WATER
Motor PW3050
([Device was not tested by us on-site])
The X’Pert PRO MPD is a highly versatile and powerful X-ray diffractometer (XRD) for structural characterization of crystalline materials.
– Perfectly suited for pure research as well as routine applications in industry and academia. Thanks to its modular design, fast detection, temperature and atmosphere control, it is equally well suited for routine analyses and complex in-situ experiments.
Key Features:
Various measurement geometries possible:
- Reflection in Bragg-Brentano (θ–2θ) mode
- Transmission geometry for powder in capillaries
- Optional SAXS (Small-Angle X-ray Scattering) for nanostructures
Radiation source and detectors:
- Typically copper anode (Cu-Kα, λ ≈ 1.54 Å)
- X’Celerator detector (1D, ultra-fast) for parallel data acquisition
Modular system with PreFIX technology:
- Fast exchange of optics and sample stages without recalibration
In-situ measurements at high temperatures:
- Measurements up to approx. 1200°C possible
- Controlled atmosphere: air, nitrogen, oxygen (limited reducing conditions)
Typical applications:
- Phase analysis and quantitative Rietveld refinement
- Determination of crystallite size, microstrain, residual stresses
- In-situ studies of phase transitions, oxidation, crystallization etc.
Lhjdpfx Aaewycatshjr
- SAXS measurements for analyzing nanoparticles, pore structures
Broad range of sample types: powders, thin films, ceramics, pharmaceuticals, catalysts, and much more.
Technical specifications (typical):
Property / Specification
Angle range (2θ) approx. 0.5° to 150°
Step size up to 0.002° or finer
Goniometer Vertical, 0–0, radius approx. 240 mm
Temperature range Room temperature up to approx. 1200°C
Atmosphere Air, N₂, O₂ (limited reducing conditions)
Detectors X’Celerator (1D), proportional counter
Prevalence & locations in use:
The X’Pert PRO MPD is used worldwide, e.g. at:
Universities (ETH Zurich, TU Dresden, University of Vienna)
Research institutes (e.g. Max Planck Institutes, ICN2, IS2M)
Industry (e.g. materials development, pharmaceuticals, chemicals)
Condition: used
Scope of delivery: (see image)
(Subject to change or errors in technical data. Specifications and information may change!)
We are happy to answer further questions by phone.
Iklan ini diterjemahkan secara otomatis. Kesalahan terjemahan mungkin terjadi.
Excerpt from service report:
Device: PANalytical X’Pert PRO MPD
Date: 2021-07-07
Work performed:
- Reinstallation and commissioning of the system
- Connection of external supply lines
- Warm-up phase
- Complete alignment of goniometer and other components
- Maintenance including replacement of defective parts
Spare parts used:
L 3.6V NC/U3 R15.0X52.0 BATTERY. NI-CD
FAN FOR X-CELERATOR UNIT FAN
FILTER FILTER, WATER
Motor PW3050
([Device was not tested by us on-site])
The X’Pert PRO MPD is a highly versatile and powerful X-ray diffractometer (XRD) for structural characterization of crystalline materials.
– Perfectly suited for pure research as well as routine applications in industry and academia. Thanks to its modular design, fast detection, temperature and atmosphere control, it is equally well suited for routine analyses and complex in-situ experiments.
Key Features:
Various measurement geometries possible:
- Reflection in Bragg-Brentano (θ–2θ) mode
- Transmission geometry for powder in capillaries
- Optional SAXS (Small-Angle X-ray Scattering) for nanostructures
Radiation source and detectors:
- Typically copper anode (Cu-Kα, λ ≈ 1.54 Å)
- X’Celerator detector (1D, ultra-fast) for parallel data acquisition
Modular system with PreFIX technology:
- Fast exchange of optics and sample stages without recalibration
In-situ measurements at high temperatures:
- Measurements up to approx. 1200°C possible
- Controlled atmosphere: air, nitrogen, oxygen (limited reducing conditions)
Typical applications:
- Phase analysis and quantitative Rietveld refinement
- Determination of crystallite size, microstrain, residual stresses
- In-situ studies of phase transitions, oxidation, crystallization etc.
Lhjdpfx Aaewycatshjr
- SAXS measurements for analyzing nanoparticles, pore structures
Broad range of sample types: powders, thin films, ceramics, pharmaceuticals, catalysts, and much more.
Technical specifications (typical):
Property / Specification
Angle range (2θ) approx. 0.5° to 150°
Step size up to 0.002° or finer
Goniometer Vertical, 0–0, radius approx. 240 mm
Temperature range Room temperature up to approx. 1200°C
Atmosphere Air, N₂, O₂ (limited reducing conditions)
Detectors X’Celerator (1D), proportional counter
Prevalence & locations in use:
The X’Pert PRO MPD is used worldwide, e.g. at:
Universities (ETH Zurich, TU Dresden, University of Vienna)
Research institutes (e.g. Max Planck Institutes, ICN2, IS2M)
Industry (e.g. materials development, pharmaceuticals, chemicals)
Condition: used
Scope of delivery: (see image)
(Subject to change or errors in technical data. Specifications and information may change!)
We are happy to answer further questions by phone.
Iklan ini diterjemahkan secara otomatis. Kesalahan terjemahan mungkin terjadi.
Penyedia
Catatan: Daftar gratis atau masuk, untuk mengakses semua informasi.
Terdaftar sejak: 2012
Kirim permintaan
Telepon & Faks
+49 2861 ... iklan
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